
Metallographic microscopy
Discuss sample preparation, observation methods and microstructural features relevant to your material.
Explore our approach to material characterization, manufacturing and custom processing. Testing and production requirements are confirmed for each project.
Testing methods, sampling and acceptance criteria depend on the material and application. Please confirm the available tests, detection limits, report format and any third-party testing with your quotation.

Discuss sample preparation, observation methods and microstructural features relevant to your material.

For suitable samples, target elements, matrix, preparation and measurement range are confirmed before testing.

Oxygen and nitrogen measurements are available for suitable materials; other gas elements and conditions require confirmation.

Methods such as titration and gravimetric analysis can be discussed according to the sample and required results.
Methods listed in company materials include XPS, TXRF, XRF, XRR, XRD, ICP-OES, ICP-MS, GDMS and EDS. Not every method applies to every material or necessarily uses in-house equipment. Phase identification by XRD, metallography, hardness and electrical conductivity measurements may also be discussed. Please specify any COA, third-party testing, dimensional tolerance or bonding inspection requirements.
Discuss testing requirements ↗Our work brings together powder metallurgy, vacuum melting, compound semiconductor processing and rare-earth metallurgy. Share your material, drawing and inspection requirements so we can discuss a suitable process.
Selected melting, consolidation, and cleanroom systems across our manufacturing and R&D facilities.



